Ultrasonic Testing Ultrasonic staged cluster imperfection finder Configuration 16:64 (16 pulser/beneficiaries, driving up to 64 components) Transducer Socket: I-PEX Pulse Voltage: - 50 V to 100V (in ventures of 10V) Architecture: Full computerized postponement and entirety engineering Digitizing Frequency: 50/100 MHz Digitizer Resolution: 12 bits Data Processing: 16 bits tests Data Recordings: Full crude information recorded Max A-Scan Length: 8192 examples (32 meters in steel LW, 50 MHZ, 1:128) Supported Scans: S-Scan and L-Scan Real Time Views: S, L, B, C-Scan, Top and End see Color Maps: 8 Standards Multi Group: Multiple Sector outputs and TFOD Conventional UT/TOFD (Mono component channels) No of Channels 2 TX/RX (2 multiplex channels) Test Mode Pulse-Echo, transmit/get, TOFD DAC Quantity: 1 with 3 sub-DAC (per central law in PA) Time Corrected Gain (TCG) A-Scan Gates: 4 doors for every A-Scan .
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